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Extended vacancy-type defects in silicon induced at low temperatures by electron irradiation
Bibliographic Information
- Title
- Extended vacancy-type defects in silicon induced at low temperatures by electron irradiation
- Author
- J.Yamasaki, S.Takeda, Y.Ohno, Y.Kimura
Journal
-
- Philos. Mag. A 83
-
Philos. Mag. A 83 151-163, 2003
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Details 詳細情報について
-
- CRID
- 1010282256777458181
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
