Patterning of Organic Semiconductors on Silicon Oxide Using an Atomic Force Microscope with an Alternating-Current Electric Field
-
- 山田 亮
- 大阪大学
書誌事項
- タイトル
- Patterning of Organic Semiconductors on Silicon Oxide Using an Atomic Force Microscope with an Alternating-Current Electric Field
- 著者
- Ryota Kimura, Ryo Yamada, Hirokazu Tada
収録刊行物
-
- App.Phys.Express 2
-
App.Phys.Express 2 2009