Reliability assessment based on hazard rate model for an embedded OSS porting phase
-
- 田村 慶信
- 山口大学
書誌事項
- タイトル
- Reliability assessment based on hazard rate model for an embedded OSS porting phase
- 著者
- Yoshinobu Tamura
収録刊行物
-
- Journal of Software Testing, Verification and Reliability
-
Journal of Software Testing, Verification and Reliability (to be published) 2011