Diagnosis of low-frequency noise sources in contact resistance of staggered organic transistors
書誌事項
- タイトル
- Diagnosis of low-frequency noise sources in contact resistance of staggered organic transistors
- 著者
- Y.Xu, R.Gwoziecki, R.Coppard, M.Benwadih, T.Minari, K.Tsukagoshi, J.A.Chroboczek, F.Balestra, G.Ghibaudo
収録刊行物
-
- Applied Physics Letters 98
-
Applied Physics Letters 98 33505-, 2010