Trace element mapping of a single cell using a hard X-ray nanobeam focused by a Kirkpatrick-Baez mirror system
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- 松山 智至
- 大阪大学
書誌事項
- タイトル
- Trace element mapping of a single cell using a hard X-ray nanobeam focused by a Kirkpatrick-Baez mirror system
- 著者
- Satoshi Matsuyama, Kazuto Yamauchi
収録刊行物
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- SPring-8 Research Frontiers 2010
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SPring-8 Research Frontiers 2010 2011年 44-45, 2011
