In-situ TEM Observation on Cu/MoOx Resistive Switching RAM

Bibliographic Information

Title
In-situ TEM Observation on Cu/MoOx Resistive Switching RAM
Author
Masaki Kudo, Yuuki Ohno, Kouichi Hamada, Masashi Arita, and Yasuo Takahashi

Journal

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Details 詳細情報について

  • CRID
    1010282257175139072
  • Article Type
    journal article
  • Data Source
    • KAKEN

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