In-situ TEM Observation on Cu/MoOx Resistive Switching RAM
Bibliographic Information
- Title
- In-situ TEM Observation on Cu/MoOx Resistive Switching RAM
- Author
- Masaki Kudo, Yuuki Ohno, Kouichi Hamada, Masashi Arita, and Yasuo Takahashi
Journal
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- Proceedings of the 2013 World Congress on Advances in Nano, Biomechanics, Robotics, and Energy Research
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Proceedings of the 2013 World Congress on Advances in Nano, Biomechanics, Robotics, and Energy Research ISBN 978-89-89693-36-9-93420 492-497, 2013
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Details 詳細情報について
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- CRID
- 1010282257175139072
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- Article Type
- journal article
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- Data Source
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- KAKEN