Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection
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- 高橋 琢二
- 東京大学
書誌事項
- タイトル
- Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection
- 著者
- Takuji Takahashi, Tadahisa Matsumoto, Shiano Ono
収録刊行物
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- Ultramicroscopy 109
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Ultramicroscopy 109 963-697, 2009