Ab initio Study of theSurface Properties and Ideal Strengthof (100) Silicon Thin Films

Bibliographic Information

Title
Ab initio Study of theSurface Properties and Ideal Strengthof (100) Silicon Thin Films
Author
Yoshitaka Umeno, Akihiro Kushima, Takayuki Kitamura, Peter Gumbsch, Ju Li

Journal

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Details 詳細情報について

  • CRID
    1010282257467096331
  • Article Type
    journal article
  • Data Source
    • KAKEN

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