Reduction of Fault Dictionary Size by Optimizing the Order of Test Patterns Application
Bibliographic Information
- Title
- Reduction of Fault Dictionary Size by Optimizing the Order of Test Patterns Application
- Author
- Yoshinobu Higami, Tsutomu Inamoto, Senling Wang, Hiroshi Takahashi, Kewal K. Saluja
Journal
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- Proc. Int. Technical Conf. on Circuits/Systems, Computers and Communications
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Proc. Int. Technical Conf. on Circuits/Systems, Computers and Communications - 131-136, 2020
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Details 詳細情報について
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- CRID
- 1010290617316835585
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- Article Type
- journal article
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- Data Source
-
- KAKEN
