Simulations of Surface X-ray Diffraction from a Monolayer <sup>4</sup>He Film Adsorbed on Graphite

DOI DOI Web Site 参考文献21件 オープンアクセス
  • Atsuki Kumashita
    Graduate School of Science, University of Hyogo, Kamigori, Hyogo 678-1297, Japan
  • Hiroo Tajiri
    Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan
  • Akira Yamaguchi
    Graduate School of Science, University of Hyogo, Kamigori, Hyogo 678-1297, Japan
  • Jun Usami
    Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan
  • Akihiko Sumiyama
    Graduate School of Science, University of Hyogo, Kamigori, Hyogo 678-1297, Japan
  • Yu Yamane
    Graduate School of Science, University of Hyogo, Kamigori, Hyogo 678-1297, Japan
  • Masaru Suzuki
    Department of Engineering Science, University of Electro-Communications, Chofu, Tokyo 182-8585, Japan
  • Tomoki Minoguchi
    Institute of Physics, The University of Tokyo, Tokyo 153-8902, Japan
  • Yoshiharu Sakurai
    Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan
  • Hiroshi Fukuyama
    Cryogenic Research Center, The University of Tokyo, Bunkyo, Tokyo 113-0032, Japan

説明

We carried out simulations of crystal truncation rod (CTR) scatterings, i.e., one of the surface X-ray diffraction techniques with atomic resolution, from a monolayer He film adsorbed on graphite. Our simulations reveal that the 00L rod scatterings from the He monolayer exhibit notable intensity modifications for those from a graphite surface in the ranges of approximately L = 0.6 - 1.7 and L = 2.2 - 3.5. The height of the He monolayer from the graphite surface largely affects the CTR scattering profiles, indicating that CTR scatterings have enough sensitivities to determine the surface structure of the various phases in the He layer. In particular, in the incommensurate solid phase, our preliminary experimental data show the intensity modulations that are expected from the present simulations.

6 pages, 4 figures, to be published in JPS Conf. Proc

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