In-situ structural analysis of organic semiconductor thin films by 2D X-ray diffraction

KAKEN

About This Project

Japan Grant Number
JP15K04647 (JGN)
Funding Program
Grants-in-Aid for Scientific Research
Funding Organization
Japan Society for the Promotion of Science

Kakenhi Information

Project/Area Number
15K04647
Research Category
Grant-in-Aid for Scientific Research (C)
Allocation Type
  • Multi-year Fund
Review Section / Research Field
  • Science and Engineering > Interdisciplinary science and engineering > Applied physics > Applied materials
Research Institution
  • Iwate University
Project Period (FY)
2015-04-01 〜 2018-03-31
Project Status
Completed
Budget Amount*help
4,940,000 Yen (Direct Cost: 3,800,000 Yen Indirect Cost: 1,140,000 Yen)

Research Abstract

In this study, we have clarified the crystal structures of dialkylated quterthiophenes (Cn-4T, n= 0, 4, 6, 8, 10, 12).) using in situ 2-dimensional grazing-incidence X-ray diffraction (2D-GIXD) during thin-film growth, and the effects of alkyl-chain length on the crystal growth mode, structure and transport properties are elucidated.

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