Study of Radiation Damage of CCD Sensors by Electron Beam Irradiation(I. Nuclear Physics)
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CCD pixel sensors are expected to have very high performance as a charged particle tracking device because of the excellent spatial resolution and the very thin material thickness of the sensitive layer. One disadvantage of CCD sensors is its relatively low radiation hardness. We have exposed CCD samples to 140 MeV electron beam of LNS and studied their radiation tolerance. Comparing with the results of ^<90>Sr irradiation test, the energy dependence of the radiation damage has been clearly seen.
紀要類(bulletin)
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収録刊行物
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- 核理研研究報告
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核理研研究報告 37 39-43, 2004-11
東北大学理学部附属原子核理学研究施設
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詳細情報 詳細情報について
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- CRID
- 1050001202726778624
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- NII書誌ID
- AN0003958X
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- ISSN
- 03852105
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- HANDLE
- 10097/31047
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- 本文言語コード
- en
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- 資料種別
- departmental bulletin paper
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- データソース種別
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- IRDB