異なる温度環境条件下における絶縁体宇宙材料の二次電子放出係数および抵抗値の測定

IR

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  • Total Electron Emission Yield and Resistance Measurement of Polyimide Film Due to Different Temperatures

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Abstract

第11回宇宙環境シンポジウム (2014年12月10日-11日. 大阪府立大学 I-siteなんば), 大阪

11th Spacecraft Environment Symposium (December 10-11, 2014, I-site Namba, Osaka Prefecture University), Osaka, Japan

Electron induced secondary electron emission from space insulator is a very important factor in understanding spacecraft charging behavior. Due to the injection of primary electrons and the emission of secondary electrons in the surface layer of insulator, the target surface will be negatively or positively charged. Additionally, the electron emission yield of the spacecraft surface materials is highly dependent on space environments, such as the temperature variation. In our tests, we chose the polyimide film (Kapton 100H) and the cover glass (CMG) the research object, and used a single short, low-density pulsed beam, and also developed a scanning method for the total electron emission yield (TEEY) measurement, which can avoid surface potential influence for insulating materials. Moreover for the TEEY system, we installed a heater for high temperature (around 100 C) and the shroud by using liquid nitrogen for low temperature (around -50 C). Under this experimental situation, TEEY of polyimide films of room, high and low temperature was tested respectively. The conductivity variation of the polyimide film and the cover glass due to the different temperatures was considered to influence TEEY.

著者名の誤記: Cho, Mungu

形態: カラー図版あり

The clerical error of an author's name: Cho, Mungu

資料番号: AA1530019016

レポート番号: JAXA-SP-14-012

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