多層配線LSIの断線故障検査に関する研究

IR Open Access

Bibliographic Information

Other Title
  • タソウ ハイセン LSI ノ ダンセン コショウ ケンサ ニ カンスル ケンキュウ
  • On testing of open faults in multi-layered wiring LSIs

Search this article

Description

Open faults are difficult to test since the floating wire occurred by an open fault has unstable voltage. In this work, the effect of adjacent lines around an open fault in multi-layered wiring LSIs is discussed. To observe the relation between an open fault and the adjacent lines, a 0.35μm CMOS IC is designed and fabricated. The open fault macros with a transmission gate and with an intentional break are included in the IC. The adjacent lines in the same layer and the different layers are placed in the test chip. The simulation and experimental results show that the voltage at the floating wire is affected by the adjacent lines.

Journal

Keywords

Details 詳細情報について

Report a problem

Back to top