X-Ray Diffraction Study of CeT2Al10 (T = Ru, Os) at Low Temperatures and under Pressures

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  • X-Ray Diffraction Study of CeT<sub>2</sub>Al<sub>10</sub> (T = Ru, Os) at Low Temperatures and under Pressures

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We have carried out a powder X-ray diffraction investigation on antiferromagnetic Kondo semiconductorsCeRu2Al10 and CeOs2Al10 at low temperatures and under high pressures as well as the structural investigationon single crystal of these compounds. The results of powder X-ray studies of CeRu2Al10 and CeOs2Al10 indicatethat these compounds do not have structural transition at its antiferromagnetic ordering temperature. The resultsof single crystal structural refinement indicate that the b-axis of this crystal structure is insensitive not only topressure but also to temperature and that the effect of cooling to Ce–Ce distance for CeRu2Al10 is the same asthat for CeOs2Al10.

Journal

  • Acta Physica Polonica A

    Acta Physica Polonica A 131 (4), 988-990, 2017

    Institute of Physics of the Polish Academy of Sciences

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