高分解能・交番磁気力顕微鏡の開発とその磁性材料・磁気デバイスへの応用

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タイトル別名
  • コウブンカイノウ ・ コウバン ジキリョク ケンビキョウ ノ カイハツ ト ソノ ジセイ ザイリョウ ・ ジキ デバイス エ ノ オウヨウ
  • Development of high-resolution alternating magnetic force microscopy and its application to advanced magnetic materials and devices

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抄録

We have developed novel magnetic force microscopy named as alternating magnetic force microscopy (A-MFM) for DC and AC magnetic fields imaging with ultra high spatial resolution of less than 5 nm. A-MFM utilizes frequency modulation of cantilever oscillation induced by applying off-resonant alternating magnetic force to high sensitive homemade magnetic tip. A-MFM is the first magnetic force microscopy which enables near-surface magnetic imaging. A-MFM has several new functionalities such as, a) zero detection of magnetic field, b) polarity detection of magnetic field, c) stroboscopic AC magnetic field imaging and d) vector DC magnetic fields imaging with selectable measuring axis.

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