A Method to Evaluate Accumulated Stress Using Nail Image
抄録
In this paper, we propose a method to evaluate accumulated stress by extraction the height of the lunula of the nail from a nail image. The proposed method consists of three stages: measurement, preprocessing, and stress evaluation. In the measurement, we take a nail image. In the preprocessing, we extract the height of the lunula of the nail. Then, we carry out edge detection using a hue histogram in a rectangle. In the stress evaluation, we evaluate accumulated stress at 0 to 1 using fuzzy reasoning. In order to show the effectiveness of the proposed method, we conducted experiments. These results suggested that the difference between the minimum and maximum values of the height of the lunula while the experiment might be able to determine the presence or absence of accumulated stress.
収録刊行物
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- Proceedings of The Fifth International Conference on Electronics and Software Science
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Proceedings of The Fifth International Conference on Electronics and Software Science 12-17, 2019
The Society of Digital Information and Wireless Communications
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詳細情報 詳細情報について
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- CRID
- 1050292572129037312
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- NII論文ID
- 120006723340
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- 本文言語コード
- en
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- 資料種別
- conference paper
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- データソース種別
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- IRDB
- CiNii Articles