Electronic density of state in valence fluctuating kondo lattice systems studied by point-contact spectroscopy (Review article)
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説明
This article reviews our recent point-contact spectroscopy (PCS) investigation in valence fluctuating Kondo lattice systems, EuNi_2P_2 and Ge-substituted EuNi_2(P_<0.8>Ge_<0.2>)_2, and YbPd. A heavy fermion (HF) compound EuNi_2P_2 exhibits a significant valence fluctuation owing to the intermediate Eu valence of 2.5 + at low temperatures, leading to a strong hybridization between the conduction and f electrons (c–f hybridization). The electronic density of state measurements on EuNi_2P_2 by using PCS technique reveal that the HF behavior arises from the formation of the indirect hybridization gap with a double-peak structure near the Fermi level due to c–f hybridization. In EuNi_2(P_<0.8>Ge_<0.2>)_2, the valence fluctuation is suppressed by the Ge substitution, and the separation of the double-peak structure decreases. These suggest that the HF behavior is induced by the valence fluctuation. In YbPd, where two-dimensional (2D) layers of Yb^<3+> and Yb^<2.6+> are alternately aligned, a HF-like behavior with a large Sommerfeld coefficient appears at low temperatures in the specific heat. The PCS spectra represent a zero-bias dip structure with an asymmetric background, reproduced by the summation of two Fano curves with two different characteristic temperatures, meaning the formation of two Kondo resonance states for each Yb^<3+> and Yb^<2.6+> site. These suggest that a local coherence causes the large Sommerfeld coefficient in the 2D layers of Yb^<3+>, which are screened by the conduction electrons provided by the valence fluctuating Yb^<2.6+> sites. The observed results indicate that PCS is a powerful technique for examining the variation of electronic DOS in valence fluctuating Kondo lattice systems.
収録刊行物
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- Low temperature physics
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Low temperature physics 49 (7), 876-885, 2023-07-01
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1050299903956919552
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- NII書誌ID
- AA10922833
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- ISSN
- 10906517
- 1063777X
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- HANDLE
- 2324/7173513
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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- IRDB