Soft X-ray Angle Resolved Photoemission with Micro Positioning Techniques for Metallic V2O3

DOI DOI IR (HANDLE) HANDLE HANDLE View 1 Remaining Hide 2 Citations Open Access

Bibliographic Information

Other Title
  • Soft X-ray angle-resolved photoemission with micro-positioning techniques for metallic V<sub>2</sub>O<sub>3</sub>

Search this article

Description

Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of several tens of µm. The photoemission spectra show a clear position dependence, reflecting the morphology of the cleaved sample surface. By selecting high-quality flat regions on the sample surface, it has been possible to perform band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional angle-resolved photoemission spectroscopy for typical three-dimensional correlated materials where large cleavage planes are rarely obtained.

Journal

Citations (2)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top