説明
A nanometer transistor, metal/insulator tunnel transistor (MITT), which consists of only metal and insulator is experimentally studied. In the MITT, the Fowler-Nordheim tunneling currents through an insulator in lateral metal/insulator/metal structure are controlled by changing a voltage at a gate electrode upon the middle insulator, due to variation of tunnel-barrier thickness at the insulator. It is demonstrated that the MITT with 16 nm channel length fabricated by conventional photolithography can operate similarly to the conventional metal/oxide/semiconductor field-effect transistor with on/off ratio of current larger than 105. The result indicates that the MITT is a promising candidate for future switching transistors in ultralarge scale integrated circuits.
identifier:https://dspace.jaist.ac.jp/dspace/handle/10119/4526
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 74 (21), 3215-3217, 1999-05-24
American Institute of Physics
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詳細情報 詳細情報について
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- CRID
- 1050564287490513280
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- NII論文ID
- 120000861416
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- ISSN
- 00036951
- 10773118
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- DOI
- 10.1063/1.124109
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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