Direct determination of Burgers vector sense and magnitude of elementary dislocations by synchrotron white x-ray topography

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書誌事項

公開日
2008-01-01
資源種別
journal article
権利情報
  • Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
DOI
  • 10.1063/1.2829806
公開者
American Institute of Physics

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説明

The x-ray topography by using highly coherent beam obtained at third-generation synchrotron facilities can provide higher spatial resolution and higher lattice-distortion sensitivity than those by former-generation facilities. Here, we report the direct determination of the Burgers vector senses and magnitudes of elementary dislocations in a high-quality silicon carbide single crystal using white x-ray section topography with a long sample-to-film distance. Our data strongly indicate that there are very weak but extraordinarily long-range elastic interactions between elementary screw dislocations. Those interactions govern dislocation-propagation behavior and the distribution of dislocations. Moreover, we found that white x-ray projection topography with a long sample-to-film distance can also be a powerful tool to effectively examine the detailed structure of elementary dislocations in single crystals.

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