Near-ultraviolet inverse photoemission spectroscopy using ultra-low energy electrons
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説明
In previous inverse photoemission spectroscopy (IPES) experiments, either X-ray (hv > 1 keV) or vacuum ultraviolet (hv ≈ 10 eV) photons were detected following the injection of electrons with energies of 10 - 1000 eV into solid materials. Here, we demonstrate IPES in the near-ultraviolet range (hv < 5 eV) using electrons with kinetic energies less than 4 eV. The energy resolution of the instrument is attained to be 0.27 eV. From the spectra of copper phthalocyanine films, it is found that damage to the organic sample is significantly reduced, demonstrating that this method is especially suitable for organic semiconducting materials.
収録刊行物
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- Chemical Physics Letters
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Chemical Physics Letters 539–540 180-185, 2012-06
Elsevier B.V.
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詳細情報 詳細情報について
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- CRID
- 1050845760662158848
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- NII論文ID
- 120004140446
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- NII書誌ID
- AA11523800
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- ISSN
- 00092614
- 18734448
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- HANDLE
- 2433/155958
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- 本文言語コード
- en
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- 資料種別
- journal article
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- データソース種別
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