Secondary arcs on solar array: Test results of EMAGS2

Gaillot, L., Fille, M. L., Levy, L.

説明

This article presents the summary of the tests performed in the frame of an ESA contract EMAGS2. While EMAGS1 concentrated its efforts on basic understanding of Electrostatic Discharge Phenomenon, EMAGS2 mainly consisted in different tests which aimed at: comparing the characteristics of the secondary arcs obtained in an electronic charging environment with those triggered in a plasma environment (inverted voltage gradient conditions in both cases) (tests in plasma gave results representative of those obtained in electron when the energy of the primary discharge was equivalent); assessing the secondary arc triggering sensitivity to materials. Current/voltage thresholds for self-sustained arc have then been determined for different Si and GaAs solar array samples (lower thresholds on GaAs); assessing the influence of the intercells gap width with regard to secondary arcs (higher secondary arc and permanent arc thresholds for large gaps); and determining the effect on solar cells of repetitive primary discharges and non-permanent secondary arcs has been studied (no impact for repetitive primary discharges and secondary arcs with low duration).

資料番号: AA0049206043

レポート番号: JAXA-SP-05-001E

収録刊行物

宇宙航空研究開発機構特別資料 = JAXA Special Publication: 9th Spacecraft Charging Technology Conference

宇宙航空研究開発機構特別資料 = JAXA Special Publication: 9th Spacecraft Charging Technology Conference JAXA-SP-05-001E 345-352, 2005-08-01

宇宙航空研究開発機構

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詳細情報詳細情報について

CRID: 1050855511201480832

NII論文ID: 120006829520

NII書誌ID: AA11984031

ISSN: 1349113X

Web Site: http://id.nii.ac.jp/1696/00006352/

本文言語コード: en

資料種別: conference paper

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