ICDS-20 : proceedings of the 20th International Conference on Defects in Semiconductors, held in Berkeley, CA, USA, 26-30 July 1999

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Bibliographic Information

Title
"ICDS-20 : proceedings of the 20th International Conference on Defects in Semiconductors, held in Berkeley, CA, USA, 26-30 July 1999"
Statement of Responsibility
guest editors, Chris Van de Walle, Wladek Walukiewicz
Publisher
  • North-Holland
Publication Year
  • c1999
Book size
27 cm

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Details 詳細情報について

  • CRID
    1130000793728153984
  • NII Book ID
    BB25713184
  • Text Lang
    en
  • Country Code
    ne
  • Title Language Code
    en
  • Place of Publication
    • [Amsterdam], The Netherlands
  • Data Source
    • CiNii Books
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