Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
CiNii
Available at 9 libraries
Bibliographic Information
- Title
- "Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A."
- Statement of Responsibility
- editors, Anthony S. Oates ... [et. al.]
- Publisher
-
- Materials Research Society
- Publication Year
-
- c1995
- Book size
- 24 cm
Search this Book/Journal
Notes
Includes index
- Tweet
Details 詳細情報について
-
- CRID
- 1130000793731256320
-
- NII Book ID
- BA26512420
-
- ISBN
- 1558992944
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
-
- Pittsburgh, Pa.
-
- Data Source
-
- CiNii Books