Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A.

CiNii Available at 2 libraries

Bibliographic Information

Title
"Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A."
Statement of Responsibility
editors, Andrew J. McKerrow ... [et al.]
Publisher
  • Materials Research Society
Publication Year
  • c2003
Book size
24 cm

Search this Book/Journal

Notes

Includes bibliographical references and indexes

Related Books

See more

Details 詳細情報について

  • CRID
    1130000793830195584
  • NII Book ID
    BA65639421
  • ISBN
    1558997032
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Warrendale, Pa.
  • Data Source
    • CiNii Books
Back to top