Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard

Name: Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
Author: Osseiran, Adam

Web Site CiNii Available at 2 libraries

Bibliographic Information

Title: "Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard"

Publisher

Publication Year

Includes bibliographical references and index

CRID

1130000793853529472
NII Book ID

BA54588577
ISBN

0792386868
LCCN

99051735
Web Site

https://lccn.loc.gov/99051735
Text Lang

en
Country Code

us
Title Language Code

en
Place of Publication
- Boston
Classification
- LCC: TK7868.P7
- DC21: 621.3815/48
Subject
- LCSH: Printed circuits -- Testing -- Standards
- LCSH: Boundary scan testing
- LCSH: Mixed signal circuits -- Testing
- LCSH: Electronic digital computers -- Circuits -- Design and construction
Data Source
- CiNii Books