Possible reliability problems affecting use of TOEIC IP Test scores

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Bibliographic Information

Title
"Possible reliability problems affecting use of TOEIC IP Test scores"
Statement of Responsibility
Brian D. Bresnihan
Publisher
  • Institute for Policy Analysis and Social Innovation, University of Hyogo
Publication Year
  • 2010
Book size
21 cm

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Notes

"University of Hyogo Monograph Vol. LXXXII"--T.p. verso

Includes bibliographical references

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Details 詳細情報について

  • CRID
    1130000793902524928
  • NII Book ID
    BB0382858X
  • Text Lang
    en
  • Country Code
    ja
  • Title Language Code
    en
  • Place of Publication
    • Kobe
  • Classification
  • Data Source
    • CiNii Books
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