Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
CiNii
Available at 7 libraries
Bibliographic Information
- Title
- "Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy"
- Statement of Responsibility
- Bert Voigtländer
- Publisher
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- Springer
- Publication Year
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- c2015
- Book size
- 25 cm
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Notes
Includes bibliogrpahical references (p. 375-376) and index
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Details 詳細情報について
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- CRID
- 1130000794003523712
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- NII Book ID
- BB18388684
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- ISBN
- 9783662452394
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- Text Lang
- en
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- Country Code
- gw
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- Title Language Code
- en
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- Place of Publication
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- Berlin
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- Subject
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- FREE: (Produktform)Hardback
- FREE: (Zielgruppe)Fachpublikum/ Wissenschaft
- FREE: (Zielgruppe)Research
- FREE: (BIC Subject Heading)TDPB
- FREE: Scanning probe microscopy
- FREE: Scanning force microscopy
- FREE: Non-contact AFM
- FREE: Cantilever detection methods
- FREE: Scanning tunneling spectroscopy
- FREE: (VLB-WN)1689: Hardcover, Softcover / Technik/Sonstiges
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- Data Source
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- CiNii Books