Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts
Bibliographic Information
- Title
- "Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts"
- Statement of Responsibility
- John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
- Publisher
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- SPIE
- Publication Year
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- c1999
- Book size
- 28 cm
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Notes
Includes bibliographic references and author index
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Details 詳細情報について
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- CRID
- 1130000794015228928
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- NII Book ID
- BA60628097
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- ISBN
- 0819434299
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- LCCN
- 00266009
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- Web Site
- https://lccn.loc.gov/00266009
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash.
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- Data Source
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- CiNii Books