Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications
Bibliographic Information
- Title
- "Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications"
- Statement of Responsibility
- edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen ; Dielectric Science & Technology and Electronics Divisions
- Publisher
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- Dielectric Science & Technology, and Electronics Divisions, Electrochemical Society
- Publication Year
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- c1992
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Details 詳細情報について
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- CRID
- 1130000794140589184
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- NII Book ID
- BA14411619
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- ISBN
- 1566770033
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- LCCN
- 92070488
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- Web Site
- https://lccn.loc.gov/92070488
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pennington, NJ
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- Data Source
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- CiNii Books