Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications

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Bibliographic Information

Title
"Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications"
Statement of Responsibility
edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen ; Dielectric Science & Technology and Electronics Divisions
Publisher
  • Dielectric Science & Technology, and Electronics Divisions, Electrochemical Society
Publication Year
  • c1992

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Details 詳細情報について

  • CRID
    1130000794140589184
  • NII Book ID
    BA14411619
  • ISBN
    1566770033
  • LCCN
    92070488
  • Web Site
    https://lccn.loc.gov/92070488
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Pennington, NJ
  • Data Source
    • CiNii Books
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