Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes

HathiTrust 1975 Web Site CiNii Available at 2 libraries

Bibliographic Information

Title
"Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes"
Statement of Responsibility
A. H. Sher
Publisher
  • U.S. G.P.O.
Publication Year
  • 1975
Book size
26 cm
Volume(Year)
  • 400-13

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Includes bibliographical references

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