Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State

CiNii Available at 14 libraries

Bibliographic Information

Title
"Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State"
Statement of Responsibility
Andreas Rosenauer
Publisher
  • Springer
Publication Year
  • c2003
Book size
24 cm

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Notes

Includes bibliographical references and index

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Details 詳細情報について

  • CRID
    1130000794258495744
  • NII Book ID
    BA61398367
  • ISBN
    3540004149
  • Text Lang
    en
  • Country Code
    gw
  • Title Language Code
    en
  • Place of Publication
    • Berlin
  • Data Source
    • CiNii Books
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