Imaging techniques for testing and inspection : seminar-in-depth, February, 1972, Los Angeles, California
Bibliographic Information
- Title
- "Imaging techniques for testing and inspection : seminar-in-depth, February, 1972, Los Angeles, California"
- Statement of Responsibility
- Editors, John C. Urbach, Byron Brenden [and] Robert Aprahamian ; SPIE co-sponsors, the American Society for Nondestructive Testing, the American Society for Testing and Materials
- Publisher
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- Society of Photo-optical Instrumentation Engineers
- Publication Year
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- c1972
- Book size
- 29 cm
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Notes
Includes bibliographical references
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Details 詳細情報について
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- CRID
- 1130000794282752256
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- NII Book ID
- BA42012611
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- LCCN
- 74189475
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- Web Site
- https://lccn.loc.gov/74189475
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Redondo Beach, Calif.
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- Subject
-
- Data Source
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- CiNii Books