Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
Bibliographic Information
- Title
- "Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico"
- Statement of Responsibility
- R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering
- Publisher
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- SPIE
- Publication Year
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- c2005
- Book size
- 28 cm
- Other Title
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- Laser metrology
- Macro-, micro, and nano-technologies applied in science, engineering, and industry
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Notes
Includes bibliographical references and author index
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Details 詳細情報について
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- CRID
- 1130000794425162496
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- NII Book ID
- BA86053886
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- ISBN
- 0819457574
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- LCCN
- 2005299106
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- Web Site
- https://lccn.loc.gov/2005299106
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash.
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- Data Source
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- CiNii Books