Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.

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Bibliographic Information

Title
"Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C."
Statement of Responsibility
edited by E. Passaglia, R.R. Stromberg and J. Kruger
Publisher
  • [For sale by the Superintendent of Documents, U.S. Government Printing Office]
Publication Year
  • 1964
Book size
24 cm

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Notes

At head of title: United States Separtment of Commerce. National Bureau of Standards

Includes bibliographical references and index

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Details 詳細情報について

  • CRID
    1130000794477894656
  • NII Book ID
    BA20408776
  • LCCN
    64060043
  • Web Site
    https://lccn.loc.gov/64060043
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • [Washington, D.C.]
  • Data Source
    • CiNii Books
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