Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

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書誌事項

タイトル
"Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China"
責任表示
Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版者
  • SPIE
出版年月
  • c1998
書籍サイズ
28 cm

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Includes bibliographical references and author index

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