High-resolution x-ray scattering from thin films and multilayers
Bibliographic Information
- Title
- "High-resolution x-ray scattering from thin films and multilayers"
- Statement of Responsibility
- Václav Holý, Ullrich Pietsch, Tilo Baumbach
- Publisher
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- Springer
- Publication Year
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- c1999
- Book size
- 24 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000795225415936
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- NII Book ID
- BA39430045
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- ISBN
- 354062029X
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- LCCN
- 98047149
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- Web Site
- https://lccn.loc.gov/98047149
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- Text Lang
- en
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- Country Code
- gw
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- Title Language Code
- en
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- Place of Publication
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- Berlin
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- Classification
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- LCC: QC1
- LCC: QC176.84.O7
- DC21: 539 s
- DC21: 530.4/175
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- Subject
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- Data Source
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- CiNii Books