Bibliographic Information
- Title
- "Semiconductor material and device characterization"
- Statement of Responsibility
- Dieter K. Schroder
- Publisher
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- Wiley
- 2nd ed
- Publication Year
-
- c1998
- Book size
- 25 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
-
- CRID
- 1130000795291071360
-
- NII Book ID
- BA36515684
-
- ISBN
- 0471241393
-
- LCCN
- 97052094
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- Web Site
- https://lccn.loc.gov/97052094
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
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- New York
-
- Classification
-
- LCC: QC611
- DC21: 621.3815/2
- NDLC: MC151
-
- Subject
-
- LCSH: Semiconductors
- LCSH: Semiconductors -- Testing
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- Data Source
-
- CiNii Books
