Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.
CiNii
Available at 3 libraries
Bibliographic Information
- Title
- "Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A."
- Statement of Responsibility
- editors: Qinghuang Lin ... [et al.]
- Publisher
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- Materials Research Society
- Publication Year
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- c2007
- Book size
- 24 cm
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Notes
"Symposium B, "Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics," the MRS "interconnect symposium", held April 10-12 at the 2007 MRS Spring Meeting in San Francisco, California ..."--Pref
Includes bibliographical references and indexes
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Details 詳細情報について
-
- CRID
- 1130000795310214528
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- NII Book ID
- BA83416338
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- ISBN
- 9781558999503
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Warrendale, Pa.
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- Data Source
-
- CiNii Books
