Bibliographic Information
- Title
- "Electron beam microanalysis"
- Statement of Responsibility
- by D. R. Beaman and J. A. Isasi
- Publisher
-
- American Society for Testing and Materials
- Publication Year
-
- [1972]
- Book size
- 28 cm
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Notes
Bibliography: p. 75-[80]
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Details 詳細情報について
-
- CRID
- 1130000795475100928
-
- NII Book ID
- BA2051708X
-
- LCCN
- 74189005
-
- Web Site
- https://lccn.loc.gov/74189005
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
-
- Philadelphia
-
- Subject
-
- LCSH: Microchemistry
- LCSH: Electron probe microanalysis
- LCSH: Electron microscopy
-
- Data Source
-
- CiNii Books
