Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts

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Bibliographic Information

Title
"Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts"
Statement of Responsibility
Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]
Publisher
  • SPIE
Publication Year
  • c1990
Book size
28 cm

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Notes

Includes bibliographical references and index

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Details 詳細情報について

  • CRID
    1130000795790013568
  • NII Book ID
    BA24456293
  • ISBN
    0819402168
  • LCCN
    89043443
  • Web Site
    https://lccn.loc.gov/89043443
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash.
  • Data Source
    • CiNii Books
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