Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts
Bibliographic Information
- Title
- "Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts"
- Statement of Responsibility
- Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]
- Publisher
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- SPIE
- Publication Year
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- c1990
- Book size
- 28 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000795790013568
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- NII Book ID
- BA24456293
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- ISBN
- 0819402168
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- LCCN
- 89043443
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- Web Site
- https://lccn.loc.gov/89043443
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash.
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- Data Source
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- CiNii Books