Measurement of transistor scattering parameters
Bibliographic Information
- Title
- "Measurement of transistor scattering parameters"
- Statement of Responsibility
- George J. Rogers and David E. Sawyer, Ramon L. Jesch
- Publisher
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- U.S. G.P.O.
- Publication Year
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- 1975
- Book size
- 26 cm
- Volume(Year)
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- 400-5
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Notes
Includes bibliographical references
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Details 詳細情報について
-
- CRID
- 1130000795863892736
-
- NII Book ID
- BA73254455
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- LCCN
- 74600204
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- Text Lang
- en
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- Country Code
- us
-
- Title Language Code
- en
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- Place of Publication
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- Washington
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- Classification
-
- LCC: QC100
- LCC: TK7871.9
- DC: 389/.08 s
- DC: 621.3815/28/028
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- Subject
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- LCSH: Transistors -- Testing
- LCSH: Electronic measurements
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- Data Source
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- CiNii Books