17th International Conference on Microscopy of Semiconducting Materials 2011, Cambridge, UK, 4-7 April 2011

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Bibliographic Information

Title
"17th International Conference on Microscopy of Semiconducting Materials 2011, Cambridge, UK, 4-7 April 2011"
Publisher
  • Institute of Physics
  • Printed from e-media with permission by Curran Associates
Publication Year
  • c2011
Book size
27 cm

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Notes

Includes bibliographical references and index

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Details 詳細情報について

  • CRID
    1130000796085992576
  • NII Book ID
    BB17704530
  • ISBN
    9781618392961
  • Text Lang
    en
  • Country Code
    uk
  • Title Language Code
    en
  • Place of Publication
    • Bristol
    • Red Hook, N.Y.
  • Classification
  • Subject
  • Data Source
    • CiNii Books
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