ARPA/NBS workshop IV. surface analysis for silicon devices

Name: ARPA/NBS workshop IV. surface analysis for silicon devices
Author: Lieberman, A. George

HathiTrust 1976 Web Site CiNii Available at 2 libraries

Bibliographic Information

Publisher

Publication Year

Volume(Year)

Includes bibliographical references and index

CRID

1130000796247586304
NII Book ID

BA73257726
LCCN

76608043
Web Site

https://lccn.loc.gov/76608043

https://catalog.hathitrust.org/Record/006865967
Text Lang

en
Country Code

us
Title Language Code

en
Place of Publication
- Washington, D.C.
Classification
- LCC: QC100
- LCC: TK7871.85
- DC: 602/.1 s
- DC: 621.3815/2
Subject
- LCSH: Semiconductors -- Testing -- Congresses
- LCSH: Silicon -- Testing -- Congresses
- LCSH: Surfaces (Technology) -- Analysis -- Congresses
- LCSH: Spectrum analysis -- Congresses
Data Source
- CiNii Books