Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts
Bibliographic Information
- Title
- "Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts"
- Statement of Responsibility
- Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center
- Publisher
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- SPIE--the International Society for Optical Engineering
- Publication Year
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- c1987
- Book size
- 28 cm
- Series Name / No
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- pbk.
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Notes
Includes bibliographies and index
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Details 詳細情報について
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- CRID
- 1130000796293985280
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- NII Book ID
- BA24042031
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- ISBN
- 089252765X
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- LCCN
- 86063732
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- Web Site
- https://lccn.loc.gov/86063732
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Data Source
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- CiNii Books