Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway

CiNii Available at 3 libraries

Bibliographic Information

Title
"Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway"
Statement of Responsibility
Kay Gastinger, Ole Johan Løkberg and Svein Winther /editors ; sponsored and organized by SINTEF (Norway) and NTNU--Norwegian University of Science and Technology (Norway) ; cooperating organizations, SPIE--The International Society for Optical Engineering and EOS-- European Optical Society
Publisher
  • SPIE--the Internatinal Society for Optical Engineering
Publication Year
  • c2003
Book size
29 cm

Search this Book/Journal

Notes

Includes bibliographical references and index

Related Books

See more

Details 詳細情報について

  • CRID
    1130000796493871872
  • NII Book ID
    BA63255961
  • ISBN
    0819447285
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash
  • Data Source
    • CiNii Books
Back to top