Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII)
Bibliographic Information
- Title
- "Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII)"
- Statement of Responsibility
- edited by V. Swaminathan...[et al.]
- Publisher
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- Electrochemical Society
- Publication Year
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- c1995
- Book size
- 23 cm
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Notes
Held at the Spring Meeting of The Electrochemical Society, Inc. May 21-26, 1995, Reno, Nevada
"Electronics and Dielectric Science and Technology Divisions."
Includes bibliographical references and indexes
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Details 詳細情報について
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- CRID
- 1130000796501169664
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- NII Book ID
- BA29954797
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- ISBN
- 1566771005
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- LCCN
- 95060441
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- Web Site
- https://lccn.loc.gov/95060441
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pennington, NJ
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- Classification
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- LCC: TK7871.99.C65
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- Data Source
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- CiNii Books