Integrated circuit failure analysis : a guide to preparation techniques
Bibliographic Information
- Title
- "Integrated circuit failure analysis : a guide to preparation techniques"
- Statement of Responsibility
- Friedrich Beck ; translated by Stephen S. Wilson
- Publisher
-
- John Wiley & Sons
- Publication Year
-
- c1998
- Book size
- 24cm
- Other Title
-
- Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen
Search this Book/Journal
Notes
Includes bibliographical references and index
Translated from the German
- Tweet
Details 詳細情報について
-
- CRID
- 1130000796594913152
-
- NII Book ID
- BA40662241
-
- ISBN
- 0471974013
-
- LCCN
- 97011255
-
- Web Site
- https://lccn.loc.gov/97011255
-
- Text Lang
- en
-
- Country Code
- uk
-
- Title Language Code
- en
-
- Place of Publication
-
- Chichester
-
- Classification
-
- DC21: 621.38152
-
- Subject
-
- LCSH: Semiconductors -- Failures
- LCSH: Semiconductors -- Testing
-
- Data Source
-
- CiNii Books