Bibliographic Information
- Title
- "Point defects in semiconductors"
- Statement of Responsibility
- M. Lannoo, J. Bourgoin ; with a foreword by J. Friedel
- Publisher
-
- Springer-Verlag
- Publication Year
-
- 1981-1983
- Book size
- 24 cm
- Series Name / No
-
- v. 1 : us
- v. 1 : gw
- v. 2 : us
- v. 2 : gw
Search this Book/Journal
Notes
v. 1. Theoretical aspects
v. 2. Experimental aspects
Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins
Includes bibliographical references and index
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Details 詳細情報について
-
- CRID
- 1130000796610937600
-
- NII Book ID
- BA01492094
-
- ISBN
- 0387105182
- 3540105182
- 0387115153
- 3540115153
-
- LCCN
- 81005354
-
- Web Site
- https://lccn.loc.gov/81005354
-
- Text Lang
- en
-
- Country Code
- gw
-
- Title Language Code
- en
-
- Place of Publication
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- Berlin ; New York
-
- Classification
-
- LCC: QC611.6.D4
- DC19: 537.6/22
- NDC8: 428.4
-
- Subject
-
- LCSH: Semiconductors -- Defects
- LCSH: Point defects
-
- Data Source
-
- CiNii Books